Next-Generation Data Acquisition: Embedded Intelligence, Machine Learning and Beyond

TECHNICAL OUTLINE

Modern data acquisition systems are evolving from passive digitizers into intelligent measurement nodes that are capable of making local decisions and adapting their behavior. This transformation is driven by advances in various areas, including software-defined instrumentation, classical adaptive signal processing, embedded machine learning, and edge inference. The session welcomes contributions connecting measurement hardware with intelligent processing, including software-defined instruments, adaptive and compressive sampling, calibration, sensor fusion, fault detection, and edge computing. Biosignal and physiological sensing, particularly wearable and embedded measurement systems, are also within scope. Rooted in TC4 (Measurement of Electrical Quantities), this session addresses a rapidly growing and cross-cutting area that extends beyond the scope of any single IMEKO Technical Committee.

ORGANIZED BY

Jakub Svatoš

Czech Technical University, Czech Republic

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Grazia Iadarola

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Ondrej Kovac

Technical University of Kosice, Slovak Republic

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KEYWORDS

Data Acquisition, Embedded Intelligence, Machine Learning, compressive sampling, calibration