Quantum technologies and metrology share a two-way relationship. On one side, quantum effects underpin the most accurate measurements we can make – the Josephson and quantum Hall effects realise the electrical units, optical clocks are driving the imminent redefinition of the second, and entanglement and squeezing push sensing beyond the standard quantum limit (“quantum for metrology”). On the other side, the emerging quantum industry increasingly needs measurement science itself: quantum computers, sensors and communication systems must be characterised, benchmarked, tested and standardised before they can be trusted, compared and deployed (“metrology for quantum”).

This Special Session focuses on this second, less-established side: reliable, SI-traceable and independent measurement, test and evaluation for quantum devices, components and systems. We invite contributions from national metrology institutes and industry partners on topics such as: characterisation, benchmarking and validation of quantum computers (“how quantum is a quantum computer”); metrology for single-photon sources, detectors and QKD components; quantum random number generation and its verification; cryogenic and microwave metrology for quantum devices; test and evaluation and conformity assessment of quantum components and supply chains; and documentary standardisation and common vocabulary for quantum technologies.

Beyond talks, the session will feature an accompanying industry exhibition with live demonstrators, showcasing quantum measurement hardware and test solutions – with a particular welcome to Italian companies. To encourage participation, we request to waive the registration fee for contributing industry partners and to provide dedicated exhibition space for their demonstrators.

quantum metrology, metrology for quantum, test and evaluation, benchmarking, single-photon metrology, standardisation