The development of advanced materials is a major driver of progress in next-generation measurement technologies, sensors, and instrumentation. Materials ranging from nanostructured to polymers, composites, and superconducting or quantum materials offer unique physical properties that can enable new measurement principles and improved device performance.

The exploitation of these materials for reliable instrumentation and measurement applications requires a multidisciplinary approach that links material synthesis and processing with characterization and device development. In particular, electrical and electromagnetic characterization, from DC to RF and microwave techniques, plays a pivotal role in understanding charge transport, dielectric behavior, and losses. Additionally, optical, thermal, mechanical, chemical, and structural characterizations can provide further information on material properties, such as composition, morphology, thermal stability, and mechanical response, thus enabling a more complete assessment of their suitability for measurement applications.

This Special Session aims to bring together researchers from academia, research institutes, and industry working at the interface between materials science and measurement science. Contributions are invited on innovative synthesis and fabrication approaches, advanced characterization methods, measurement techniques for material properties, and the design and validation of sensors, transducers, and other measurement devices based on advanced materials.